Simulated SAM A-scans on multilayer MEMS components

نویسندگان

  • Jakob Janting
  • Dirch Hjorth Petersen
  • Christoffer Greisen
چکیده

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 42  شماره 

صفحات  -

تاریخ انتشار 2002